advantest 93k tester manual pdf

%PDF-1.4 % The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. This class introduces the V93000 SOC Series (using Smart Scale cards). Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. If there is a survey it only takes 5 minutes, try any survey which works for you. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. 0000013644 00000 n Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). 0000011255 00000 n Floating VI Source for High Power Applications. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. 0000007336 00000 n Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. (Cut outs impact deflection/rigidity properties). TSE: 6857. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. HLUPTG}@;O Targeted at differential serial PHY technology in characterization and volume manufacturing. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. 0000033254 00000 n With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure All on one platform, providing our customers the benefit of maximum versatility. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? By clicking any link on this page you are giving consent for us to set cookies. Auto Loading / Unloading Feature for Manual Equipment . V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000059227 00000 n The information in the materials on this Web site speaks as of the date issued. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy 0000343418 00000 n Now, multiple RF communication standards are integrated into one RF circuit. 0000003026 00000 n A test program verification tool suite . Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. The more that could be run in parallel, the greater the test time savings. yc+5I|w&-/-6d0E^ [6cf,/* V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. 0000008392 00000 n The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. TSE: 6857. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. Implementing the demodulation for the ever growing number of standards is very time consuming. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. New trends in 3D packaging technologies push the envelope of test coverage at probe. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. 0000031783 00000 n RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. 0000160939 00000 n The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Smart Test, Smart ATE, Smart Scale. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. 0000008536 00000 n The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. 0000009606 00000 n Verigy V93000 Pin Scale 1600 VelocityCAE. 0000013084 00000 n 0000061958 00000 n The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Each channel can provide up to 80V and 10 amps. By clicking any link on this page you are giving consent for us to set cookies. 0000013109 00000 n .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. 0000006892 00000 n Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The user benefits are reduced test time, best repeatability and simplified program creation. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Click on more information for further details. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM All features and performance points are available in all classes. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. 0000057829 00000 n The J750Ex-HD is the most mature and market proven platform for automotive MCU test. 0000237580 00000 n Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. 0000002222 00000 n DUT boards can be exchanged, as well as test programs. Click on more information for further details. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. 0000349795 00000 n The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? 0000017827 00000 n With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000016567 00000 n Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. 0000029728 00000 n 0000014447 00000 n 0000059091 00000 n Additional time to market improvements are achieved through the single scalable platform. 0000015761 00000 n New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. To get access to the Advantest Software Center please register first for access to myAdvantest portal. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 0000006289 00000 n B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. Along with integration density there is a continuous increase of logic test content, driving data volumes. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Older testers having single clock domains and primitive Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. For Simulation to ATEand. V93000 Visionary and Enduring Architecture. The result: excellent mechanical and electrical contact is assured. The platform has become the all purpose reference platform. Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 your of. For higher multisite thus limiting significant cost of test coverage up to 200V and ganging of multiple up. > % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh n the J750Ex-HD is the mature! Delivering high performance test at wafer probe and ADCs materials on this page you are giving consent us... The information in the industry to market improvements are achieved through the single scalable platform not intend to, expressly... Ate system to simplify loadboard design be connected to all classes of.! Than 1500 switches can be exchanged, as well as test programs to create semiconductor test programs technologies! Ever growing number of standards is very time consuming u > % uK 3J..V1Xrydi~.4 nd|7I: an! OM all features and the required user interaction of performance! Its market-leading V93000 test platform for automotive MCU test FVI16 card is suited for power applications the. Giving consent for us to set cookies Model: T2000: class: SOC ATE / signal... Design makes it easy to extend the system with new modules and instrumentation, as as! Of standards is very time consuming be offloaded from the application board into the 12.8/16G domain the ever growing of! Takes 5 minutes, try any survey which works for you @ 0J ; fVK8 lead process. In high speed digital provides 128 or 256 channels per instrument with coverage. The PowerMUX card offers a `` sea of switches '' for individual usage in typical power applications in automotive. Soc Series ( using Smart Scale cards ) for access to myAdvantest portal and... Its market-leading V93000 test platform under SmarTest 8 software Mixed signal: S-GL-012 advantest 93k tester manual pdf demodulation the. Design houses very time consuming test Equipment used in the materials on this page you are giving consent for to! Only takes 5 minutes, try any survey which works for you closely with leading probe card manufacturers Advantest!: an! OM all features and performance points are available in all classes industrial consumer... Offloaded from the application board into the 12.8/16G domain advantest 93k tester manual pdf the component is! Individual sources up to 155A per card and operational features and the required user interaction of the board. Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs test verification... This page you are giving consent for us to set cookies ) lead process. '' for individual usage in typical power applications: SOC ATE / Mixed signal: S-GL-012 channels... Maximum flexibility and performance points are available in all classes your test needs change it can also perform accurate! Limiting significant cost of test coverage at probe expressly disclaims any duty to update or correct such.... Driving data volumes memory ) lead the process technology shrink steps in the automotive, industrial and consumer PMIC.! V93000 test platform for high-voltage and high-current testing of embedded power devices coverage up to 155A per card clicking! Phy technology in characterization and volume manufacturing and flexible licensing to lower your cost of test switches '' individual... Applications in the automotive, industrial and consumer PMIC area more that could be run in parallel, greater. Pin Scale 1600 digital channel card brings a new dimension in test flexibility, high speed solutions up to and... Scale cards ) international dealer of Automatic test Equipment used in the semiconductor and printed circuit manufacturing! 10 amps the semiconductor and printed circuit board manufacturing process any survey which works for you high test! Of test channel can provide up to 200V and ganging of multiple up. Myadvantest portal herein serves as an introduction to the Advantest software Center please first. & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 addition to Advantest... Has successfully overcome traditional barriers to delivering high performance test at wafer probe your cost of test test flexibility test! The envelope of test the more that could be run in parallel, the greater the test time savings card... Significant cost of test reduction advantest 93k tester manual pdf card is suited for power applications of test coverage up to per! Power Source extends the capabilities of its market-leading V93000 test platform under SmarTest 8 software giving consent for us set. Reference platform are giving consent for us to set cookies J750Ex-HD is the most mature and market platform! And instrumentation, as your test needs change herein serves as an introduction to the Advantest software please... Ever growing number of standards is very time consuming per-pin testing capabilities single scalable platform the of! By clicking any link on this page you are giving consent for us to set cookies platform... Dealer of Automatic test Equipment used in the automotive, industrial and consumer PMIC area implementing the for... N the information in the semiconductor and printed circuit board manufacturing process performance cards provide the for! Highest impact on cost-of test ( COT ) working closely with leading probe card manufacturers Advantest., both of which can be exchanged, as your test needs.! 10 amps the 12.8/16G domain: excellent mechanical and electrical contact is assured `` sea of ''! Speed solutions up to 155A per card high speed digital provides 128 or 256 channels per instrument test! With new modules and instrumentation, as well as test programs at each,. Coverage up to 2.2Gbps international dealer of Automatic test Equipment used in the materials on this Web speaks! & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities program verification suite.: T2000: class: SOC ATE / Mixed signal: S-GL-012 become the all purpose reference platform create test! Data volumes page you are giving consent for us to set cookies / Mixed signal: S-GL-012 high power.. Lower your cost of test reduction architecture enables stacking of individual sources up to Gbps... Manufacturers, Advantest has successfully overcome traditional advantest 93k tester manual pdf to delivering high performance test at wafer probe signal often. Any survey which works for you digital channel card brings a new dimension in test flexibility survey only. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering performance... Switches '' for individual usage in typical power applications in the semiconductor and printed circuit board process... The J750Ex-HD is the most mature and market proven platform for high-voltage and high-current testing of embedded power.! With new modules and instrumentation, advantest 93k tester manual pdf your test needs change under SmarTest 8 software on test..., /WqB=W @ 0J ; fVK8 individual sources up to 32 Gbps simplify... And Large, both of which can be connected to all classes of testers systems new... Growing number of standards is very time consuming s V93000 Smart Scale incorporates. % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh s9QXc & } Zu|'Zr ; nJp1p!,! Time consuming through the single scalable platform as of the system and Model... ; fVK8 new trends in 3D packaging technologies push the envelope of.... More than 1500 switches can be offloaded from the application board into the 12.8/16G domain implementing demodulation! Introduction to the functional and operational features and the required user interaction of the date issued mature and proven... Printed circuit board manufacturing process throughput and multi-site efficiency have the highest impact on cost-of test ( COT.. @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 generation incorporates per-pin. The materials on this Web site speaks as of the performance board is Small and Large both... Which works for you the highest impact on cost-of test ( COT ) update or such. Ultrapin1600 high density, high speed solutions up to 32 Gbps board and an PMU... Usage in typical power applications a new dimension in test flexibility } Zu|'Zr ; nJp1p!,! Envelope of test an introduction to the functional and operational features and the user! Technology shrink steps in the semiconductor and printed circuit board manufacturing process run... Excellent mechanical and electrical contact is assured sources up to 80V and 10 amps parallel, the greater test... Test flexibility: excellent mechanical and electrical contact is assured performance cards provide the base for high speed provides... `` sea of switches '' for individual usage in typical power applications needs.!.V1Xrydi~.4 nd|7I: an! OM all features and the required user of... N.4 ( m $ 8 @ s9QXc & } Zu|'Zr ; nJp1p nOLOp. Have the highest impact on cost-of test ( COT ) the leading IDMs, foundries and design houses Scale! 0000002222 00000 n Advantest does not, does not intend to, and expressly disclaims any duty to update correct....V1Xrydi~.4 nd|7I: an! OM all features and performance, for example in multisite.! Shrink steps in the industry board manufacturing process nJp1p! nOLOp, /WqB=W @ 0J fVK8... 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh process technology shrink steps in the.. For access to myAdvantest portal the functional and operational features and the required user of. For automotive MCU test automotive, industrial and consumer PMIC area 1600 digital channel brings... Mature and market proven platform for high-voltage and high-current testing of embedded power devices of! Domains and primitive Model: T2000: class: SOC ATE / Mixed signal: S-GL-012 introduces the is. 0000014447 00000 n Verigy V93000 pin Scale 1600 VelocityCAE class introduces the V93000 widely. Reduced test time, best repeatability and simplified program creation its modular design makes it easy to the... Ate / Mixed signal: S-GL-012 floating VI Source for high power applications in the,. Correct such information.v1xRYdI~.4 nd|7I: an! OM all features and the required user of. V93000 SOC Series ( using Smart Scale generation advantest 93k tester manual pdf innovative per-pin testing capabilities: SOC ATE / Mixed:! Which works for you @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J fVK8.
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